发明名称 Measuring cell damage for wear leveling in a non-volatile memory
摘要 <p>An NVM controller measures cell damage for wear leveling in an NVM, thus improving performance, reliability, lifetime, and/or cost of a storage sub-system, such as an SSD. In a first aspect, the controller determines that an error reading a page of NVM was caused by cell damage and/or cell leakage. The controller reprograms and immediately reads back the page, detecting that the error was caused by cell damage if an error is detected during the immediate read. In a second aspect, the cell damage is tracked by updating cell damage counters for pages and/or blocks of NVM. In a third aspect, wear leveling is performed based at least in part upon measured cell damage for pages and/or blocks of NVM.</p>
申请公布号 EP2709110(A1) 申请公布日期 2014.03.19
申请号 EP20130184158 申请日期 2013.09.12
申请人 LSI CORPORATION 发明人 LI, YAN;HUBRIS, ALEXANDER;ZHONG, HAO
分类号 G11C29/42;G06F12/02;G11C16/34;G11C29/50;G11C29/52 主分类号 G11C29/42
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