ONE-TIME PROGRAMABLE MEMORY OF ELECTRICAL FUSE TYPE WITH HIGH RELIABILITY FOR PMICS

摘要

The present invention relates to an electrical fuse (e-fuse) one-time programmable (OTP) memory structure with a high reliability for a PMIC which comprises: an OTP cell array of 1 row x 24 columns; a control logic for supplying an internal control signal; a PGM_COL_SEL circuit for selecting a column to be programmed; a data latch circuit for storing program data; a DOUT buffer for reading BL data; and a comparison circuit for comparing whether the program data PD′23:0′and the data DOUT′23:0′are identical. As a result, the high reliability of the PMIC is guaranteed by enabling a test by the data in which a presence of a program error is outputted after programming the e-fuse OTP memory.