发明名称 In-line System for testing LED
摘要 PURPOSE: An in-line type light emitting diode (LED) inspection system and a control method thereof are provided to consecutively implement a lighting inspection, an optical property inspection, and a withstand voltage inspection on an LED lamp on one conveying line, thereby reducing time for inspection. CONSTITUTION: An in-line type light emitting diode (LED) inspection system includes a loading part (100), an unloading part (700), a conveying part (800), and an optical property measuring part (600). The loading part loads an LED lamp (10) to be inspected on a module mounting part (30). The unloading part unloads the lamp after an inspection on the lamp is finished. The module mounting part is mounted on the conveying unit, and the conveying unit has a conveying line connecting the loading part and the unloading part in order to consecutively convey the lamps. The optical property measuring part on the conveying line measures light source information including the intensity and color information of a light from the lamp, determines whether or not the optical property of the lamp is normal with comparing the light source information with the referential information of the lamp, or determines the grade of the lamp.
申请公布号 KR101376537(B1) 申请公布日期 2014.03.19
申请号 KR20120001499 申请日期 2012.01.05
申请人 发明人
分类号 G01J1/02;G01J1/08;G01J1/10;G01J3/46 主分类号 G01J1/02
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