发明名称 Plasma processing apparatus and processing gas supply structure thereof
摘要 There is provided a plasma processing apparatus for generating inductively coupled plasma in a processing chamber and performing a process on a substrate accommodated in the processing chamber. The plasma processing apparatus includes an upper cover installed to cover a top opening of the processing chamber and having a dielectric window; a high frequency coil installed above the dielectric window at an outer side of the processing chamber; a gas supply mechanism supported by the upper cover and installed under the dielectric window. Here, the gas supply mechanism includes a layered body including plates having through holes. Further, the gas supply mechanism is configured to supply a processing gas into the processing chamber in a horizontal direction via groove-shaped gas channels installed between the plates or between the plate and the dielectric window, and end portions of the groove-shaped gas channels are opened to edges of the through holes.
申请公布号 US8674607(B2) 申请公布日期 2014.03.18
申请号 US201113115193 申请日期 2011.05.25
申请人 IIZUKA HACHISHIRO;TOKYO ELECTRON LIMITED 发明人 IIZUKA HACHISHIRO
分类号 H01J7/24 主分类号 H01J7/24
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