发明名称 Single layer BGA substrate process
摘要 Embodiments of the present disclosure provide semiconductor packaging techniques that form a substrate using metal and insulating materials. The substrate includes a first surface that is bonded to a semiconductor device and a second surface that is bonded to a printed circuit board. The substrate is formed using several techniques that minimize the amount of mask levels used to form the substrate. For example, a metal substrate is patterned to form a three dimensional pattern on the surface. A dielectric material is deposited on the three dimensional pattern. Using several patterning and polishing embodiments described herein, the metal/dielectric substrate is patterned and polished to form a substantially flush surface that is bonded to the semiconductor device. In one embodiment, the top surface of the metal/dielectric substrate is patterned to expose the underlying metal substrate and the bottom surface of the metal substrate is polished to be substantially flush with the dielectric material.
申请公布号 US8673689(B2) 申请公布日期 2014.03.18
申请号 US201213358405 申请日期 2012.01.25
申请人 LIOU SHIANN-MING;KAO HUAHUNG;MARVELL WORLD TRADE LTD. 发明人 LIOU SHIANN-MING;KAO HUAHUNG
分类号 H01L21/00 主分类号 H01L21/00
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