发明名称 Transistor having an adjustable gate resistance and semiconductor device comprising the same
摘要 A memory device comprises an array of memory cells each capable of storing multiple bits of data. The memory cells are arranged in memory strings that are connected to a common source line. Each memory cell includes a programmable transistor connected in series with a resistance. The transistor includes a gate dielectric that is switchable between a plurality of different resistance values. The threshold voltage of the transistor changes according to the resistance value of the gate dielectric. Memory states of the memory cells can thus be associated with respective resistance values of the dielectric layer of the transistor.
申请公布号 US8675381(B2) 申请公布日期 2014.03.18
申请号 US20100839842 申请日期 2010.07.20
申请人 LUE HANG-TING;CHANG KUO-PIN;MACRONIX INTERNATIONAL CO., LTD. 发明人 LUE HANG-TING;CHANG KUO-PIN
分类号 G11C5/06 主分类号 G11C5/06
代理机构 代理人
主权项
地址