发明名称 Semiconductor device and method of self-confinement of conductive bump material during reflow without solder mask
摘要 A semiconductor device has a semiconductor die with a die bump pad and substrate with a trace line and integrated bump pad. Conductive bump material is deposited on the substrate bump pad or die bump pad. The semiconductor die is mounted over the substrate so that the bump material is disposed between the die bump pad and substrate bump pad. The bump material is reflowed without a solder mask around the die bump pad or substrate bump pad to form an interconnect. The bump material is self-confined within a footprint of the die bump pad or substrate bump pad. The bump material can be immersed in a flux solution prior to reflow to increase wettability. Alternatively, the interconnect includes a non-fusible base and fusible cap. The volume of bump material is selected so that a surface tension maintains self-confinement of the bump material within the bump pads during reflow.
申请公布号 US8674500(B2) 申请公布日期 2014.03.18
申请号 US201113218653 申请日期 2011.08.26
申请人 PENDSE RAJENDRA D.;STATS CHIPPAC, LTD. 发明人 PENDSE RAJENDRA D.
分类号 H01L23/48;H01L21/44 主分类号 H01L23/48
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