发明名称 METHOD OF FORMING AN OPENING AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE USING THE SAME
摘要 <p>In a method of forming an opening according to one embodiment of the present invention, a first alignment mark is formed in a second region of a substrate which includes a first region and the second region. An etching object layer including a crystalline material is formed on the substrate and the first alignment mark. The etching object layer part located in the first region become amorphous. The amorphous etching object layer part is etched.</p>
申请公布号 KR20140032538(A) 申请公布日期 2014.03.17
申请号 KR20120095495 申请日期 2012.08.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG, JONG HOON;KIM, TAE GON;CHOI, HAN MEI;JO, EUN YOUNG
分类号 H01L21/027;H01L21/268 主分类号 H01L21/027
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