发明名称 MASK DRAWING DEVICE AND CORRECTION METHOD OF ELECTRON BEAM
摘要 PROBLEM TO BE SOLVED: To provide a mask drawing device which inhibits drift of an electron beam, and to provide a correction method of the electron beam.SOLUTION: A mask drawing device includes: an electronic lens-barrel which radiates an electron beam to a mask substrate; a pipeline which supplies a cooling medium to an object to be cooled disposed in the electronic lens-barrel; temperature adjustment means for adjusting a temperature of the cooling medium; a temperature gauge which is provided most near the object to be cooled and on an outward way of the pipeline; and correction means which corrects a radiation position of the electron beam according to the temperature measured by the temperature gauge.
申请公布号 JP2014049690(A) 申请公布日期 2014.03.17
申请号 JP20120193340 申请日期 2012.09.03
申请人 NUFLARE TECHNOLOGY INC 发明人 TSURUTA KAORU
分类号 H01L21/027;G03F1/78;H01J37/305 主分类号 H01L21/027
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