发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a technology of achieving high integration of a semiconductor device which employs a TSV technique.SOLUTION: A semiconductor device comprises through electrodes which include a small-diameter through electrode TE1 which is formed in a semiconductor substrate SW on a principal surface S1 side and has a first diameter and a large-diameter through electrode TE2 which is formed in the semiconductor substrate SW on a rear face S2 side and has a second diameter larger than the first diameter. The small-diameter through electrode TE1 is arranged inside the large-diameter through electrode TE2 in planar view in a manner such that the center position of the small-diameter through electrode TE1 does not overlap the center position of the large-diameter through electrode TE2 in planar view.
申请公布号 JP2014049500(A) 申请公布日期 2014.03.17
申请号 JP20120189177 申请日期 2012.08.29
申请人 RENESAS ELECTRONICS CORP 发明人 KITAO RYOHEI;TSUCHIYA YASUAKI
分类号 H01L21/3205;H01L21/768;H01L23/522 主分类号 H01L21/3205
代理机构 代理人
主权项
地址
您可能感兴趣的专利