发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a technology of achieving high integration of a semiconductor device which employs a TSV technique.SOLUTION: A semiconductor device comprises through electrodes which include a small-diameter through electrode TE1 which is formed in a semiconductor substrate SW on a principal surface S1 side and has a first diameter and a large-diameter through electrode TE2 which is formed in the semiconductor substrate SW on a rear face S2 side and has a second diameter larger than the first diameter. The small-diameter through electrode TE1 is arranged inside the large-diameter through electrode TE2 in planar view in a manner such that the center position of the small-diameter through electrode TE1 does not overlap the center position of the large-diameter through electrode TE2 in planar view. |
申请公布号 |
JP2014049500(A) |
申请公布日期 |
2014.03.17 |
申请号 |
JP20120189177 |
申请日期 |
2012.08.29 |
申请人 |
RENESAS ELECTRONICS CORP |
发明人 |
KITAO RYOHEI;TSUCHIYA YASUAKI |
分类号 |
H01L21/3205;H01L21/768;H01L23/522 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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