发明名称 ELECTRONIC COMPONENT TESTER
摘要 PROBLEM TO BE SOLVED: To provide an electronic component tester that includes a cooling mechanism capable of efficiently cooling the inside of the tester while suppressing noise.SOLUTION: An electronic component tester 1 includes: a test module 100 on which an electronic component testing device is mounted; a control module 200 and power supply unit 300 that control the test module 100; a first cooling mechanism including a cooling fan 16 that cools the inside of the test module 100; and a second cooling mechanism including a cooling fan 311 that cools the inside of the control module 200 and power supply unit 300. The first cooling mechanism and second cooling mechanism are independent of each other.
申请公布号 JP2014048202(A) 申请公布日期 2014.03.17
申请号 JP20120192439 申请日期 2012.08.31
申请人 ADVANTEST CORP 发明人 NISHIURA TAKAHIDE;MATSUNAGA SEIGO
分类号 G01R31/26 主分类号 G01R31/26
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