发明名称 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN
摘要 PROBLEM TO BE SOLVED: To provide a resist composition that enables production of a resist pattern with excellent line edge roughness.SOLUTION: A resist composition contains a resin including a structural unit having a group represented by formula (xx), and at least one selected from the group consisting of a structural unit represented by formula (a1-1) and a structural unit represented by formula (a1-2), and an acid generator, where Xrepresents a 2-18C trivalent hydrocarbon group which may have a substituent, Rrepresents a hydrogen atom or a 1-12C hydrocarbon group, Land Lrepresent -O- or *-O-(CH)-CO-O-, and k1 represents an integer of 1-7.
申请公布号 JP2014044415(A) 申请公布日期 2014.03.13
申请号 JP20130156427 申请日期 2013.07.29
申请人 SUMITOMO CHEMICAL CO LTD 发明人 MASUYAMA TATSURO;YOSHIDA MASASHI;ICHIKAWA KOJI
分类号 G03F7/038;C08F20/10;G03F7/039;H01L21/027 主分类号 G03F7/038
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