发明名称 SAMPLE AND HOLD CIRCUIT, A/D CONVERTER, AND SAMPLE AND HOLD CIRCUIT CALIBRATION METHOD AND CIRCUIT
摘要 A pipelined A/D converter, for which a plurality of stages 1 to N, containing a multiplying digital to analog converter (MDAC), are cascaded, is configured so a Gain-AMP (12) contained in the MDAC at a SPM comprises: MOS transistors (Mx1 and Mx2) as a differential pair joining an output terminal to a next stage sampling capacitor (CsI+1); MOS transistors (My1 and My2) as a load section connected to the differential pair; a current source (I3) for supplying a current to the MOS transistors (Mx1 and Mx2) serving as the differential pair; and current sources (I1 and I2) for regulating a current flowing to the MOS transistors (My1 and My2) serving as the load section.
申请公布号 WO2014038138(A1) 申请公布日期 2014.03.13
申请号 WO2013JP04838 申请日期 2013.08.12
申请人 ASAHI KASEI MICRODEVICES CORPORATION 发明人 MIYAHARA, YUICHI
分类号 H03M1/14;H03M1/08 主分类号 H03M1/14
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