METHODS AND SYSTEMS FOR CLOUD COMPUTING TO MITIGATE INSTRUMENT VARIABILITY IN A TEST ENVIRONMENT

摘要

A system and a method for cloud computing to mitigate instrument variability in a test environment are provided. The system including a test station configured to receive and test a device under test (DUT); a station server configured to provide a data correction algorithm to the memory circuit in the test station; and a data collection server configured to receive test data associated to the DUT in the test station. The data collection server may be further configured to provide a data correction algorithm for the test station to the station server.