发明名称 POSITIVE RESIST COMPOSITION, AND RESIST FILM, RESIST-COATED MASK BLANK, RESIST PATTERN FORMING METHOD AND PHOTOMASK EACH USING THE COMPOSITION
摘要 A positive resist composition contains: (A) a polymer compound having a structure where a hydrogen atom of a phenolic hydroxyl group is replaced by an acid labile group represented by the following formula (I): wherein R represents a monovalent organic group; A represents a group having a polycyclic hydrocarbon ring structure or a group having a polycyclic heterocyclic structure; and * represents a bonding position to an oxygen atom of the phenolic hydroxyl group.
申请公布号 US2014072905(A1) 申请公布日期 2014.03.13
申请号 US201314073322 申请日期 2013.11.06
申请人 FUJIFILM CORPORATION 发明人 TSUCHIMURA TOMOTAKA;INASAKI TAKESHI
分类号 G03F1/22;G03F1/20;G03F7/039 主分类号 G03F1/22
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