发明名称 Tunnel field-effect transistors with superlattice channels
摘要 A semiconductor device includes a channel region; a gate dielectric over the channel region; a gate electrode over the gate dielectric; and a first source/drain region adjacent the gate dielectric. The first source/drain region is of a first conductivity type. At least one of the channel region and the first source/drain region includes a superlattice structure. The semiconductor device further includes a second source/drain region on an opposite side of the channel region than the first source/drain region. The second source/drain region is of a second conductivity type opposite the first conductivity type. At most, one of the first source/drain region and the second source/drain region comprises an additional superlattice structure.
申请公布号 US8669163(B2) 申请公布日期 2014.03.11
申请号 US20100898421 申请日期 2010.10.05
申请人 BHUWALKA KRISHNA KUMAR;WANG CHING-YA;GOTO KEN-ICHI;LEE WEN-CHIN;DIAZ CARLOS H.;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 BHUWALKA KRISHNA KUMAR;WANG CHING-YA;GOTO KEN-ICHI;LEE WEN-CHIN;DIAZ CARLOS H.
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
主权项
地址