发明名称 LIFT-OFF PROCESSING FOR FORMATION OF ISOLATION REGIONS IN LASER DIODE STRUCTURES
摘要 A method of fabricating a laser diode structure is provided where a photolithographic process is utilized to form at least a portion of an axially extending waveguide structure such that a patterned photoresist remnant resides over the axially extending waveguide structure following the photolithographic process. A patterned isolated opening and a lift-off photoresist portion are formed in the patterned photoresist remnant by subjecting the patterned photoresist remnant to an additional photolithographic process such that the lift-off photoresist portion remains in residence over the axially extending waveguide structure following the additional photolithographic process. An insulating layer is formed over the patterned isolated opening and the lift-off photoresist portion.
申请公布号 KR20140030197(A) 申请公布日期 2014.03.11
申请号 KR20137030651 申请日期 2012.05.22
申请人 CORNING INCORPORATED 发明人 LIU SHIWEN;PADDOCK BARRY J;ZAH CHUNG EN
分类号 H01S5/20;H01S5/10 主分类号 H01S5/20
代理机构 代理人
主权项
地址