发明名称 |
LIFT-OFF PROCESSING FOR FORMATION OF ISOLATION REGIONS IN LASER DIODE STRUCTURES |
摘要 |
A method of fabricating a laser diode structure is provided where a photolithographic process is utilized to form at least a portion of an axially extending waveguide structure such that a patterned photoresist remnant resides over the axially extending waveguide structure following the photolithographic process. A patterned isolated opening and a lift-off photoresist portion are formed in the patterned photoresist remnant by subjecting the patterned photoresist remnant to an additional photolithographic process such that the lift-off photoresist portion remains in residence over the axially extending waveguide structure following the additional photolithographic process. An insulating layer is formed over the patterned isolated opening and the lift-off photoresist portion. |
申请公布号 |
KR20140030197(A) |
申请公布日期 |
2014.03.11 |
申请号 |
KR20137030651 |
申请日期 |
2012.05.22 |
申请人 |
CORNING INCORPORATED |
发明人 |
LIU SHIWEN;PADDOCK BARRY J;ZAH CHUNG EN |
分类号 |
H01S5/20;H01S5/10 |
主分类号 |
H01S5/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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