发明名称 Robust transistors with fluorine treatment
摘要 A semiconductor device, and particularly a high electron mobility transistor (HEMT), having a plurality of epitaxial layers and experiencing an operating (E) field. A negative ion region in the epitaxial layers to counter the operating (E) field. One method for fabricating a semiconductor device comprises providing a substrate and growing epitaxial layers on the substrate. Negative ions are introduced into the epitaxial layers to form a negative ion region to counter operating electric (E) fields in the semiconductor device. Contacts can be deposited on the epitaxial layers, either before or after formation of the negative ion region.
申请公布号 US8669589(B2) 申请公布日期 2014.03.11
申请号 US201113112285 申请日期 2011.05.20
申请人 WU YIFENG;MOORE MARCIA;WISLEDER TIM;PARIKH PRIMIT;CREE, INC. 发明人 WU YIFENG;MOORE MARCIA;WISLEDER TIM;PARIKH PRIMIT
分类号 H01L29/66 主分类号 H01L29/66
代理机构 代理人
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