发明名称 Semiconductor device and method of manufacturing the same
摘要 A semiconductor device includes a first semiconductor layer of a first conductivity type, a second semiconductor layer formed in contact with the first semiconductor layer, and a third semiconductor layer of a second conductivity type formed in contact with the second semiconductor layer, the first semiconductor layer provided with a first semiconductor region at a given distance from an interface between the first semiconductor layer and the second semiconductor layer, and an impurity concentration of the first semiconductor region higher than an impurity concentration of the first semiconductor layer except where the first semiconductor region is formed.
申请公布号 US8669576(B2) 申请公布日期 2014.03.11
申请号 US201113207761 申请日期 2011.08.11
申请人 TAKAHASHI TSUYOSHI;FUJITSU LIMITED 发明人 TAKAHASHI TSUYOSHI
分类号 H01L33/00 主分类号 H01L33/00
代理机构 代理人
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