| 摘要 |
A device for detecting the periodic defect of a thick plate is provided. The device for detecting the periodic defect of a thick plate comprises: a garbor filter module for filtering the surface image of the thick plate using a garbor filter; a binarization module for binarizing the filtered surface image of the thick plate; and a periodic defect detection module for detecting blobs, which are separated at regular intervals in the longitudinal direction of the thick plate among multiple blobs contained in the binarized surface image of the thick plate, as the periodic defect. The device for detecting the periodic defect of a thick plate according to the present invention can detect the periodic defect of a thick plate and especially hot levelling marks. [Reference numerals] (210) Garbor filter module; (220) Binarization module; (230) Image division module; (240) Periodic defect detection module |
