发明名称 Apparatus for the Automated Testing and Validation of Electronic Components
摘要 An automatic test equipment (ATE) unit, which incorporates a mass interconnect system. The mass interconnect system is provided with a universal mounting table for use with receiver and test interface modules for electronically mounting and testing a variety of different types of electronic components or unit under test thereon. The mounting table test interface module incorporates MEMS based spring contacts to provide high-speed micro test-channels in order to establish signal connectivity between the components or unit under test and the tester, and which maintain the signal integrity up to 50 GHz without significant signal loss distortion.
申请公布号 US2014062516(A1) 申请公布日期 2014.03.06
申请号 US201214006020 申请日期 2012.03.07
申请人 RASHIDZADEH RASHID;AHMADI MAJID;KANDALAFT NABEEH;UNIVERSITY OF WINDSOR 发明人 RASHIDZADEH RASHID;AHMADI MAJID;KANDALAFT NABEEH
分类号 G01R1/04 主分类号 G01R1/04
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