发明名称 |
QUALITY EVALUATION APPARATUS, QUALITY EVALUATION METHOD, AND EVALUATION SUBSTRATE |
摘要 |
In a quality evaluation method, an evaluation substrate that includes a mounting region, in which a multilayer capacitor is to be mounted, in a center portion of the evaluation substrate is fixed in place using a plurality of fixed portions at corner portions of the evaluation substrate, each of which is a same distance from the mounting region. A voltage is applied to the multilayer capacitor mounted on the mounting region of the evaluation substrate. Sound is collected using a microphone that is near the multilayer capacitor mounted on the evaluation substrate. |
申请公布号 |
US2014060192(A1) |
申请公布日期 |
2014.03.06 |
申请号 |
US201313966445 |
申请日期 |
2013.08.14 |
申请人 |
MURATA MANUFACTURING CO., LTD. |
发明人 |
HATTORI KAZUO;FUJIMOTO ISAMU;YAMADA TADATERU |
分类号 |
G01N29/04 |
主分类号 |
G01N29/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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