发明名称 QUALITY EVALUATION APPARATUS, QUALITY EVALUATION METHOD, AND EVALUATION SUBSTRATE
摘要 In a quality evaluation method, an evaluation substrate that includes a mounting region, in which a multilayer capacitor is to be mounted, in a center portion of the evaluation substrate is fixed in place using a plurality of fixed portions at corner portions of the evaluation substrate, each of which is a same distance from the mounting region. A voltage is applied to the multilayer capacitor mounted on the mounting region of the evaluation substrate. Sound is collected using a microphone that is near the multilayer capacitor mounted on the evaluation substrate.
申请公布号 US2014060192(A1) 申请公布日期 2014.03.06
申请号 US201313966445 申请日期 2013.08.14
申请人 MURATA MANUFACTURING CO., LTD. 发明人 HATTORI KAZUO;FUJIMOTO ISAMU;YAMADA TADATERU
分类号 G01N29/04 主分类号 G01N29/04
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