| 摘要 |
PROBLEM TO BE SOLVED: To provide a new X-ray inspection device capable of accurately capturing an area of a supplemental material to be masked present in an inspection target object, even when a shape and an accommodation position of the supplemental material are not determined, and inspecting mixing-in of foreign substances in the inspection target object from an X-ray image of an area other than the area of the supplemental material.SOLUTION: An X-ray inspection device extracts a shading edge of an X-ray image transmitted through an inspection target object, extracts subsequently an area of a supplemental material from the extracted edge area and supplemental material specification conditions set in advance, and inspects the presence of foreign substances in an area of the X-ray image other than the area of the extracted supplemental material. |
