| 摘要 |
There is provided a detection arrangement for detecting an attack to internal signals in a semiconductor device. The detection arrangement comprises a first input terminal, a second input terminal, and a comparison unit. The first input terminal is adapted to receive a first signal being indicative for a signal at a first stage of a driver of the semiconductor device, the driver being capable to drive signals internally to the semiconductor device. The second input terminal is adapted to receive a second signal being indicative for a signal at a second stage of the driver of the semiconductor device. The comparison unit is adapted to compare the first signal and the second signal and to determine a time period during which the signals are equal, wherein the determined time period is indicative for a potential attack, if the determined time period is above a predefined threshold. |
