发明名称 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN
摘要 PROBLEM TO BE SOLVED: To provide a resist composition capable of producing a resist pattern excellent in CD uniformity (CDU).SOLUTION: The resin composition contains: (A1) a resin which contains a structural unit represented by formula (I) and a structural unit represented by formula (a4) and has no acid-labile group; (A2) a resin having an acid-labile group; and an acid generator. [In the formulae, Rrepresents a hydrogen atom or a methyl group; Rrepresents a C3-C18 alicyclic hydrocarbon group; Lrepresents a C1-C18 divalent saturated hydrocarbon group or a single bond; Rrepresents a hydrogen atom or a methyl group; and Rrepresents a C1-C24 saturated hydrocarbon group having a fluorine atom.]
申请公布号 JP2014041346(A) 申请公布日期 2014.03.06
申请号 JP20130154225 申请日期 2013.07.25
申请人 SUMITOMO CHEMICAL CO LTD 发明人 MASUYAMA TATSURO;YAMAGUCHI NORIFUMI;ICHIKAWA KOJI
分类号 G03F7/038;C08F220/24;G03F7/039;H01L21/027 主分类号 G03F7/038
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