发明名称 |
RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN |
摘要 |
PROBLEM TO BE SOLVED: To provide a resist composition capable of producing a resist pattern excellent in CD uniformity (CDU).SOLUTION: The resin composition contains: (A1) a resin which contains a structural unit represented by formula (I) and a structural unit represented by formula (a4) and has no acid-labile group; (A2) a resin having an acid-labile group; and an acid generator. [In the formulae, Rrepresents a hydrogen atom or a methyl group; Rrepresents a C3-C18 alicyclic hydrocarbon group; Lrepresents a C1-C18 divalent saturated hydrocarbon group or a single bond; Rrepresents a hydrogen atom or a methyl group; and Rrepresents a C1-C24 saturated hydrocarbon group having a fluorine atom.] |
申请公布号 |
JP2014041346(A) |
申请公布日期 |
2014.03.06 |
申请号 |
JP20130154225 |
申请日期 |
2013.07.25 |
申请人 |
SUMITOMO CHEMICAL CO LTD |
发明人 |
MASUYAMA TATSURO;YAMAGUCHI NORIFUMI;ICHIKAWA KOJI |
分类号 |
G03F7/038;C08F220/24;G03F7/039;H01L21/027 |
主分类号 |
G03F7/038 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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