摘要 |
PROBLEM TO BE SOLVED: To provide methods, apparatus, and systems to detect potential errors in information in a flash memory device.SOLUTION: This invention includes methods, apparatus, and systems to scan at least a portion of a memory device (350), when a condition for scanning is met (340). The condition for scanning may be dependent on one or more of a number of read operations, a number of write operations, time, and others (310). Other embodiments including additional methods, apparatus, and systems are disclosed. |