发明名称 LOW COST MANUFACTURE OF HIGH REFLECTIVITY ALUMINUM NITRIDE SUBSTRATES
摘要 <p>A sintered aluminum nitride substrate having a thermal conductivity of about 60 W/m-K to about 150 W/m-K, a flexural strength of about 200MPa to about 325MPa, a volume resistivity of greater than 1010 Ohm cm, a density of at least about 95% of theoretical, optionally at least 97%, and a reflectance factor of at least about 60% substantially over the wavelength range of 360nm to 820nm. A low temperature process for sintering aluminum nitride includes providing an AlN sintering formulation of AlN powder and a sintering aid of yttria, calcia, and optionally added alumina, forming the AlN sintering formulation into a green body, and sintering the green body at a temperature of about 1675°C to 1750°C.</p>
申请公布号 WO2014035766(A1) 申请公布日期 2014.03.06
申请号 WO2013US56010 申请日期 2013.08.21
申请人 CMC LABORATORIES, INC. 发明人 HARRIS, JONATHAN H.;NEMECEK, THOMAS;TESCH, ROBERT
分类号 H01L33/02;H01L33/10 主分类号 H01L33/02
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