发明名称 |
METHOD FOR PRODUCING SILICON CARBIDE SINGLE CRYSTAL AND SILICON CARBIDE SINGLE CRYSTAL |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for producing a SiC single crystal having a high wafer in-plane yield and a high yield of the wafer and a SiC single crystal obtained by such method.SOLUTION: From an initial stage to a middle stage of growth, a single crystal is grown on a surface of a seed crystal facilitating the growth of a facet region while suppressing the expansion of the facet region (first growing step). In a later stage of growth, the single crystal is further grown facilitating the growth of a non-facet region so that the growth height is uniformed (second growth step). The growth rate is regulated by making a temperature distribution and/or a concentration distribution of a raw material gas nonuniform in the first growth step and by inverting or uniformizing the temperature distribution and/or the concentration distribution of a raw material gas in the second growth step. |
申请公布号 |
JP2014040357(A) |
申请公布日期 |
2014.03.06 |
申请号 |
JP20120184657 |
申请日期 |
2012.08.23 |
申请人 |
TOYOTA CENTRAL R&D LABS INC;DENSO CORP;SHOWA DENKO KK |
发明人 |
GUNJISHIMA TSUKURU;KONDO HIROYUKI;MATSUSE AKIHIRO |
分类号 |
C30B29/36 |
主分类号 |
C30B29/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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