发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device having an ESD protection diode that has large ESD resistance and small ineffective area.SOLUTION: A semiconductor device 60 includes a semiconductor region 50 provided on a semiconductor substrate 5 via an insulating film 17 and in which a diode is formed, and first and second electrodes 20 and 21 connected to the semiconductor region. The semiconductor region is provided in a band form so that its long sides extend along the outer periphery of the semiconductor substrate. The PN junction of the diode extends along the long sides of the semiconductor region and is exposed on an end surface along short sides of the semiconductor region. The first and second electrodes are provided spaced apart from the end surface from which the PN junction is exposed.
申请公布号 JP2014042052(A) 申请公布日期 2014.03.06
申请号 JP20130214895 申请日期 2013.10.15
申请人 TOSHIBA CORP 发明人 NOZU TETSUO
分类号 H01L21/822;H01L21/8234;H01L27/04;H01L27/06;H01L27/088;H01L29/78;H01L29/861;H01L29/868 主分类号 H01L21/822
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