发明名称 Memory Device with Charge Trap
摘要 A memory cell system is provided forming a first insulator layer over a semiconductor substrate, forming a charge trap layer over the first insulator layer, forming an intermediate layer over the charge trap layer, and forming a second insulator layer with the intermediate layer.
申请公布号 US2014061771(A1) 申请公布日期 2014.03.06
申请号 US201314076415 申请日期 2013.11.11
申请人 SPANSION, LLC.;ADVANCED MICRO DEVICES, INC. 发明人 DING MENG;JOSHI AMOL RAMESH;XUE LEI;ORIMOTO TAKASHI;CHANG KUO-TUNG
分类号 H01L27/115;H01L29/792 主分类号 H01L27/115
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