发明名称 METHOD FOR MANUFACTURING INTERFACE PASSIVATION STRUCTURE AND PHOTOELECTRIC CONVERSION ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing SiNfilm having high passivation performance by clarifying the relationship between a hydrogen gas introduction at the time of deposition of the SiNfilm and the passivation performance of the SiNfilm.SOLUTION: When a SiNfilm is deposited in contact with a SiOfilm chemically deposited on a substrate, hydrogen gas is introduced to deposit SiNfilm.
申请公布号 JP2014041983(A) 申请公布日期 2014.03.06
申请号 JP20120184545 申请日期 2012.08.23
申请人 SHARP CORP 发明人 KURIMOTO YUJI
分类号 H01L21/318;H01L21/316;H01L31/06 主分类号 H01L21/318
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