发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To manufacture and provide a highly reliable semiconductor device provided with thin film transistors having stable electric characteristics.SOLUTION: A method of manufacturing a semiconductor device provided with thin film transistors each employing an oxide semiconductor film as a semiconductor layer containing a channel formation region includes: carrying out a heat treatment for dehydration or dehydrogenation that enhances purity of the oxide semiconductor film and reduces impurities such as moisture; reducing impurities such as moisture contained not only in the oxide semiconductor film but in a gate insulation layer; and reducing impurities such as moisture contained at an interface between a film and the oxide semiconductor film provided vertically in contact with each other.
申请公布号 JP2014042038(A) 申请公布日期 2014.03.06
申请号 JP20130196494 申请日期 2013.09.24
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人
分类号 H01L29/786;G02F1/1368;G09F9/30;H01L51/50;H05B33/08;H05B33/10;H05B33/14 主分类号 H01L29/786
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