发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To manufacture and provide a highly reliable semiconductor device provided with thin film transistors having stable electric characteristics.SOLUTION: A method of manufacturing a semiconductor device provided with thin film transistors each employing an oxide semiconductor film as a semiconductor layer containing a channel formation region includes: carrying out a heat treatment for dehydration or dehydrogenation that enhances purity of the oxide semiconductor film and reduces impurities such as moisture; reducing impurities such as moisture contained not only in the oxide semiconductor film but in a gate insulation layer; and reducing impurities such as moisture contained at an interface between a film and the oxide semiconductor film provided vertically in contact with each other. |
申请公布号 |
JP2014042038(A) |
申请公布日期 |
2014.03.06 |
申请号 |
JP20130196494 |
申请日期 |
2013.09.24 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
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分类号 |
H01L29/786;G02F1/1368;G09F9/30;H01L51/50;H05B33/08;H05B33/10;H05B33/14 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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