发明名称 SYSTEM AND METHOD FOR CONTROLLING GAS CONCENTRATION IN A TWO-CHAMBER GAS DISCHARGE LASER SYSTEM
摘要 <p>Methods and systems for controlling the gas concentrations in the chambers of a two chamber gas discharge laser such as an excimer laser are disclosed. A first set of inject opportunities is selected for the laser chamber of the master oscillator, and a second set of inject opportunities is selected for the laser chamber of the power amplifier. At each selected inject opportunity for the master oscillator, its laser chamber receives an inject containing a fixed amount of a non-halogen containing gas, and a calculated amount of a halogen containing gas. At the selected inject opportunities for the power amplifier, its laser chamber receives a fixed amount of the halogen containing gas, and may also receive a fixed amount of the non-halogen containing gas.</p>
申请公布号 KR20140026502(A) 申请公布日期 2014.03.05
申请号 KR20137030595 申请日期 2012.03.27
申请人 CYMER, LLC 发明人 RIGGS DANIEL J.
分类号 H01S3/036;H01S3/22 主分类号 H01S3/036
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