发明名称
摘要 PROBLEM TO BE SOLVED: To provide a specimen analysis device and a specimen analysis method for preliminarily avoiding unnecessary preparation of a measurement sample, and for accurately executing analysis of components whose sizes are different by determining necessity of redetection in accordance with reliability. SOLUTION: A specimen analysis device includes: a sample preparation part for preparing first and second measurement samples from a specimen; a detection part having a flow cell, a light emission part for irradiating the first measurement sample or the second measurement sample passing through the flow cell with rays of light and a light reception part for receiving the rays of light from the first measurement sample or the second measurement sample irradiated with rays of light for detecting predetermined components included in the first measurement sample or the second measurement sample; and a control part for determining whether or not the result of detection of predetermined components in the first measurement sample is reliable. When the result of detection of the predetermined components in the first measurement sample is not reliable, the operation of the sample preparation part is controlled to prepare the second measurement sample on the basis of the same specimen, and the predetermined components in the prepared second measurement sample are detected by the detection part. COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP5432390(B2) 申请公布日期 2014.03.05
申请号 JP20130007669 申请日期 2013.01.18
申请人 发明人
分类号 G01N35/08;G01N15/14;G01N33/48;G01N33/49;G01N35/00 主分类号 G01N35/08
代理机构 代理人
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