| 摘要 |
In an absolute position encoder, a multi-spectral light source illuminates a position on a topographic surface at an angle of incidence determined from a vector normal to the surface. A target on, and positionally-registered to, the topographic surface comprises a variable grating that diffracts the incident light to form a multi-spectral diffraction pattern in which the angular dispersion of the diffraction pattern varies with the absolute position of the incident light along the grating. A chromatically responsive sensor detects a narrow band of the diffraction pattern through an entrance aperture positioned at an angle of detection determined from the vector normal to the topographic surface and outputs a signal responsive to the change in the angular dispersion of the detected narrow band of the diffraction pattern. The source/sensor unit maintains (within an acceptable noise tolerance) its geometric relationship to the vector normal to the topographic surface at the position of illumination. A processing element uses a system transfer function to map the detected signal to an absolute-position on the topographic surface. |
