| 摘要 |
The present invention relates to a method for testing cryptography circuits. It also relates to a secure cryptography circuit capable of being tested. The cryptography circuit includes registers and logic gates, and a test thereof performs a differential power analysis on the registers of the circuit. A cryptography circuit being secure and including a first half-circuit associated with a second half-circuit operating in complementary logic, the electric power supply of the first half-circuit is separated from the electric power supply of the second half-circuit, the differential power analysis being carried out in parallel on each half-circuit, the two power supplies being combined into one and the same electric power supply after the test. |
