发明名称 |
A SIMPLE AND STABLE REFERENCE FOR IR-DROP AND SUPPLY NOISE MEASUREMENTS |
摘要 |
<p>Apparatus and method for IR-drop and supply noise measurements in electronic circuits. A first voltage at a point of interest in the circuit is sampled and stored during a quiescent mode of the circuit the voltage is to be measured in. Subsequently, the circuit is brought in an operating mode and a second voltage is sampled and held at the same point of interest. The first and the second voltage are compared and a corresponding voltage signal is passed to a system output.</p> |
申请公布号 |
EP2374014(B1) |
申请公布日期 |
2014.03.05 |
申请号 |
EP20090764073 |
申请日期 |
2009.11.18 |
申请人 |
NXP B.V. |
发明人 |
VEENDRICK, HENDRICUS JOSEPH MARIA;PELGROM, MARCEL;ZIEREN, VICTOR |
分类号 |
G01R31/30;G01R19/165 |
主分类号 |
G01R31/30 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|