发明名称 A SIMPLE AND STABLE REFERENCE FOR IR-DROP AND SUPPLY NOISE MEASUREMENTS
摘要 <p>Apparatus and method for IR-drop and supply noise measurements in electronic circuits. A first voltage at a point of interest in the circuit is sampled and stored during a quiescent mode of the circuit the voltage is to be measured in. Subsequently, the circuit is brought in an operating mode and a second voltage is sampled and held at the same point of interest. The first and the second voltage are compared and a corresponding voltage signal is passed to a system output.</p>
申请公布号 EP2374014(B1) 申请公布日期 2014.03.05
申请号 EP20090764073 申请日期 2009.11.18
申请人 NXP B.V. 发明人 VEENDRICK, HENDRICUS JOSEPH MARIA;PELGROM, MARCEL;ZIEREN, VICTOR
分类号 G01R31/30;G01R19/165 主分类号 G01R31/30
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