发明名称 Method for testing MEMS devices
摘要 A method for determining the presence of a sacrificial layer (41c, 41d, 41e) under a structure (40a, 40b, 40c, 40d, 40e) comprises: providing at least one structure (40a, 40b, 40c, 40d, 40e) arranged above a substrate having a major surface lying in a plane, the at least one structure (40a, 40b, 40c, 40d, 40e) being clamped at at least one side, exerting a force, for example mechanical force, on the at least one structure (40a, 40b, 40c, 40d, 40e), the force, for example mechanical force, having a predetermined amplitude and having a component perpendicular to the substrate, determining the deflection of the at least one structure (40a, 40b, 40c, 40d, 40e) perpendicular to the plane of the substrate, and correlating the deflection of the at least one structure (40a, 40b, 40c, 40d, 40e) to the presence of a sacrificial layer (41c, 41d, 41e) between the substrate and the structure (40a, 40b, 40c, 40d, 40e).
申请公布号 EP2202197(B1) 申请公布日期 2014.03.05
申请号 EP20090179359 申请日期 2009.12.15
申请人 IMEC 发明人 VAN BAREL, GREG
分类号 B81C99/00 主分类号 B81C99/00
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