发明名称 SEMICONDUCTOR MEMORY DEVICE AND FABRICATION METHOD THEREOF
摘要 <p>Disclosed are a semiconductor memory device capable of improving the electrical contact property of an access device and a lower electrode and a fabrication method thereof. According to an embodiment of the present technology, the semiconductor memory device may include an access device of a pillar shape formed on a semiconductor substrate, a first conductive layer which is self-aligned with the access device, a protection layer of a designated thickness and width formed on the upper edge of the first conductive layer, and a lower electrode electrically connected to the first conductive layer.</p>
申请公布号 KR20140026155(A) 申请公布日期 2014.03.05
申请号 KR20120093196 申请日期 2012.08.24
申请人 SK HYNIX INC. 发明人 CHAE, SU JIN;KIM, JIN HYOCK;KWON, YOUNG SEOK
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
代理机构 代理人
主权项
地址