发明名称 Field effect transistor with narrow bandgap source and drain regions and method of fabrication
摘要 A transistor having a narrow bandgap semiconductor source/drain region is described. The transistor includes a gate electrode formed on a gate dielectric layer formed on a silicon layer. A pair of source/drain regions are formed on opposite sides of the gate electrode wherein said pair of source/drain regions comprise a narrow bandgap semiconductor film formed in the silicon layer on opposite sides of the gate electrode.
申请公布号 US8664694(B2) 申请公布日期 2014.03.04
申请号 US201313752272 申请日期 2013.01.28
申请人 CHAU ROBERT S.;DATTA SUMAN;KAVALIEROS JACK;BRASK JUSTIN K.;DOCZY MARK L.;METZ MATTHEW;INTEL CORPORATION 发明人 CHAU ROBERT S.;DATTA SUMAN;KAVALIEROS JACK;BRASK JUSTIN K.;DOCZY MARK L.;METZ MATTHEW
分类号 H01L29/66 主分类号 H01L29/66
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