发明名称 Non-volatile memory devices having resistance changeable elements and related systems and methods
摘要 A non-volatile memory device may include a first wordline on a substrate, an insulating layer on the first wordline, and a second wordline on the insulating layer so that the insulating layer is between the first and second wordlines. A bit pillar may extend adjacent the first wordline, the insulating layer, and the second wordline in a direction perpendicular with respect to a surface of the substrate, and the bit pillar may be electrically conductive. In addition, a first memory cell may include a first resistance changeable element electrically coupled between the first wordline and the bit pillar, and a second memory cell may include a second resistance changeable element electrically coupled between the second wordline and the bit pillar. Related methods and systems are also discussed.
申请公布号 US8664633(B2) 申请公布日期 2014.03.04
申请号 US201113220777 申请日期 2011.08.30
申请人 PARK HEUNG-KYU;PARK IN-SUN;BAEK IN-GYU;LEE BYEONG-CHAN;KANG SANG-BOM;SONG WOO-BIN;SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK HEUNG-KYU;PARK IN-SUN;BAEK IN-GYU;LEE BYEONG-CHAN;KANG SANG-BOM;SONG WOO-BIN
分类号 H01L29/06 主分类号 H01L29/06
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