发明名称 |
Method for accelerated lifetesting of large area OLED lighting panels |
摘要 |
A method for accelerated life testing of organic devices is provided. The lifetime of each of one or more individual organic emissive devices is measured at a non-heating current density. Based upon the measured lifetimes of the one or more devices, the device lifetime is determined for a selected luminance. An organic emissive panel is also obtained having a second organic stack that consists essentially of the one or more organic layers of the first organic stack. The junction temperature of the organic emissive panel is then determined at a heating current density. Based upon the junction temperature and the device lifetime of the one or more individual organic emissive devices, the expected lifetime of the organic emissive panel is then determined at the heating current density. |
申请公布号 |
US8664970(B2) |
申请公布日期 |
2014.03.04 |
申请号 |
US201113047221 |
申请日期 |
2011.03.14 |
申请人 |
LEVERMORE PETER;PANG HUIQING;MICHALSKI LECH;WEAVER MIKE;UNIVERSAL DISPLAY CORPORATION |
发明人 |
LEVERMORE PETER;PANG HUIQING;MICHALSKI LECH;WEAVER MIKE |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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