| 摘要 |
Methods and apparatus for measuring fluorescence, are described. The method includes measuring at least one profile of at least a portion of a surface of a sample, the surface extending substantially transverse an axis, and illuminating the portion of the sample surface with radiation for stimulating fluorescence. The intensity of the radiation varies with position along the axis. Values indicative of the spatial intensity distribution of fluorescence emitted from said portion of the sample surface are measured. The measured values of fluorescence are modified to take account of the spatial variation in intensity of radiation incident upon the surface by utilizing the measured profile. |
