发明名称 INFORMATION PROCESSING APPARATUS, TEST DATA GENERATING APPARATUS, AND TEST DATA GENERATING METHOD
摘要 An apparatus has a first operation model containing connection information indicating a connecting relation between pins of the integrated circuits including a first integrated circuit and a second integrated circuit and containing a designation of an output pin for outputting data to the outside of the first integrated circuit or a designation of an input pin for inputting the data from the outside of the first integrated circuit, and a second operation model containing a designation of the output pin or the input pin outside the second integrated circuit and having a definition of an interface specification for inputting and outputting the data to the input pin and the output pin of the second integrated circuit via the communication pin.
申请公布号 US2014058699(A1) 申请公布日期 2014.02.27
申请号 US201313959771 申请日期 2013.08.06
申请人 FUJITSU LIMITED 发明人 OKAMOTO HIROSHI
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
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