发明名称 CHEMICAL MECHANICAL POLISHING COMPOSITION COMPRISING NON-IONIC SURFACTANT AND AROMATIC COMPOUND COMPRISING AT LEAST ONE ACID GROUP
摘要 A chemical mechanical polishing composition comprising: (A) inorganic particles, organic particles, or a mixture or composite thereof, wherein the particles are cocoon-shaped, (B) a non-ionic surfactant, (C) an aromatic compound comprising at least one acid group, or a salt thereof, and (M) an aqueous medium. A process for the manufacture of semiconductor devices comprising the chemical mechanical polishing of a substrate in the presence of a CMP composition and the use of CMP composition in the semiconductor industry are also provided.
申请公布号 WO2014006546(A3) 申请公布日期 2014.02.27
申请号 WO2013IB55273 申请日期 2013.06.27
申请人 BASF SE;BASF SCHWEIZ AG;BASF (CHINA) COMPANY LIMITED 发明人 REICHARDT, ROBERT;LAUTER, MICHAEL;LI, YUZHUO
分类号 G09G1/02;C09K3/14;G09G1/14 主分类号 G09G1/02
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