发明名称 |
CHEMICAL MECHANICAL POLISHING COMPOSITION COMPRISING NON-IONIC SURFACTANT AND AROMATIC COMPOUND COMPRISING AT LEAST ONE ACID GROUP |
摘要 |
A chemical mechanical polishing composition comprising: (A) inorganic particles, organic particles, or a mixture or composite thereof, wherein the particles are cocoon-shaped, (B) a non-ionic surfactant, (C) an aromatic compound comprising at least one acid group, or a salt thereof, and (M) an aqueous medium. A process for the manufacture of semiconductor devices comprising the chemical mechanical polishing of a substrate in the presence of a CMP composition and the use of CMP composition in the semiconductor industry are also provided. |
申请公布号 |
WO2014006546(A3) |
申请公布日期 |
2014.02.27 |
申请号 |
WO2013IB55273 |
申请日期 |
2013.06.27 |
申请人 |
BASF SE;BASF SCHWEIZ AG;BASF (CHINA) COMPANY LIMITED |
发明人 |
REICHARDT, ROBERT;LAUTER, MICHAEL;LI, YUZHUO |
分类号 |
G09G1/02;C09K3/14;G09G1/14 |
主分类号 |
G09G1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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