发明名称 MASS SPECTROMETER
摘要 PROBLEM TO BE SOLVED: To provide a mass spectrometer capable of performing mass analysis with sufficiently high resolution.SOLUTION: A mass spectrometer 1 includes: a sample plate 3 which is transparent to laser light L and to which a matter M to be measured is stuck; a support base 4 on which the sample plate 3 is placed and which partially includes a light transmission part for transmitting laser light; a light irradiation part 23 allowed to irradiate laser light from the rear side of the sample plate to the matter to be measured and including a laser light source 9 for outputting the laser light, a condensing lens 12 for condensing the laser light into the matter to be measured, and an aberration correction mechanism 11 for correcting an aberration generated in concentration of the laser light; and a detector 24 for detecting the matter M to be measured which is desorbed from a surface of the sample plate 3 and ionized by irradiation of the laser light.
申请公布号 JP2014038752(A) 申请公布日期 2014.02.27
申请号 JP20120179702 申请日期 2012.08.14
申请人 FUJIFILM CORP 发明人 YAMAZOE SHOGO;NAYA MASAYUKI
分类号 H01J49/10;G01N27/64;H01J49/04 主分类号 H01J49/10
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