发明名称 SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREFOR
摘要 Provided are a semiconductor structure and a manufacturing method therefor. The method comprises the following steps: providing a substrate (100), forming a grating stack on the substrate (100) and forming source/drain regions (110) in the substrate (100); etching the source/drain regions (110), so as to form grooves (111); forming contact layers (112) on the surfaces of the etched source/drain regions (110); forming stress generation material layers (113) in the grooves (111); and depositing an interlayer dielectric layer (300) and forming a contact plug which is in contact with the stress generation material. The grooves (111) are formed by etching the source/drain regions (110), so as to increase the exposed regions of the source/drain regions (110); then the contact layers (112) are formed on the surfaces of the source/drain regions (110), and the grooves (111) are filled with the stress generation material; and stress is also introduced into a channel while effectively reducing the contact resistance between the source/drain regions (110) and the contact layers (112), so that the carrier mobility in the channel is improved, thereby improving the performance of the semiconductor structure.
申请公布号 WO2014029150(A1) 申请公布日期 2014.02.27
申请号 WO2012CN81511 申请日期 2012.09.17
申请人 INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;ZHONG, HUICAI;LIANG, QINGQING;ZHAO, CHAO;LUO, JUN 发明人 ZHONG, HUICAI;LIANG, QINGQING;ZHAO, CHAO;LUO, JUN
分类号 H01L21/335;H01L21/308;H01L29/78 主分类号 H01L21/335
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