发明名称 |
SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREFOR |
摘要 |
Provided are a semiconductor structure and a manufacturing method therefor. The method comprises the following steps: providing a substrate (100), forming a grating stack on the substrate (100) and forming source/drain regions (110) in the substrate (100); etching the source/drain regions (110), so as to form grooves (111); forming contact layers (112) on the surfaces of the etched source/drain regions (110); forming stress generation material layers (113) in the grooves (111); and depositing an interlayer dielectric layer (300) and forming a contact plug which is in contact with the stress generation material. The grooves (111) are formed by etching the source/drain regions (110), so as to increase the exposed regions of the source/drain regions (110); then the contact layers (112) are formed on the surfaces of the source/drain regions (110), and the grooves (111) are filled with the stress generation material; and stress is also introduced into a channel while effectively reducing the contact resistance between the source/drain regions (110) and the contact layers (112), so that the carrier mobility in the channel is improved, thereby improving the performance of the semiconductor structure. |
申请公布号 |
WO2014029150(A1) |
申请公布日期 |
2014.02.27 |
申请号 |
WO2012CN81511 |
申请日期 |
2012.09.17 |
申请人 |
INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;ZHONG, HUICAI;LIANG, QINGQING;ZHAO, CHAO;LUO, JUN |
发明人 |
ZHONG, HUICAI;LIANG, QINGQING;ZHAO, CHAO;LUO, JUN |
分类号 |
H01L21/335;H01L21/308;H01L29/78 |
主分类号 |
H01L21/335 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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