发明名称 TRENCH DEVICES HAVING IMPROVED BREAKDOWN VOLTAGES AND METHOD FOR MANUFACTURING SAME
摘要 In one embodiment, the present invention includes a semiconductor power device. The semiconductor power device comprises a trenched gate and a trenched field region. The trenched gate is disposed vertically within a trench in a semiconductor substrate. The trenched field, region is disposed vertically within the trench and below the trenched gate. A lower portion of the trenched field region tapers to dispose an electric field.
申请公布号 US2014054683(A1) 申请公布日期 2014.02.27
申请号 US201213646906 申请日期 2012.10.08
申请人 CHUANG CHIAO-SHUN;HUANG TONY 发明人 CHUANG CHIAO-SHUN;HUANG TONY
分类号 H01L29/78 主分类号 H01L29/78
代理机构 代理人
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