发明名称 SEMICONDUCTOR DEVICE, FABRICATING METHOD THEREOF AND SEMICONDUCTOR PACKAGE INCLUDING THE SEMICONDUCTOR DEVICE
摘要 In one embodiment, a semiconductor device includes a semiconductor substrate having a first surface, and a second surface opposite to the first surface. The second surface defines a redistribution trench. The substrate has a via hole extending therethrough. The semiconductor device also includes a through via disposed in the via hole. The through via may include a via hole insulating layer, a barrier layer, sequentially formed on an inner wall of the via hole. The through via may further include a conductive connector adjacent the barrier layer. The semiconductor device additionally includes an insulation layer pattern formed on the second surface of the substrate. The insulation layer pattern defines an opening that exposes a region of a top surface of the through via. The semiconductor devices includes a redistribution layer disposed in the trench and electrically connected to the through via. The insulation layer pattern overlaps a region of the conductive connector.
申请公布号 US2014057430(A1) 申请公布日期 2014.02.27
申请号 US201314072777 申请日期 2013.11.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE HO-JIN;CHO TAE-JE;JANG DONG-HYEON;SONG HO-GEON;JEONG SE-YOUNG;KANG UN-BYOUNG;YOON MIN-SEUNG
分类号 H01L21/768 主分类号 H01L21/768
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