发明名称
摘要 Provided is a temperature control device for controlling a temperature of a member to be exposed to plasma in a substrate processing apparatus. The substrate processing apparatus includes a mounting electrode for mounting a target substrate and a facing electrode positioned to face the mounting electrode, excites a processing gas supplied between the mounting electrode and the facing electrode into plasma, and performs a plasma process on the target substrate with the plasma. The temperature control device includes a heating layer configured to heat a heating target member, a heat insulating layer positioned in contact with an opposite surface to a heating layer's surface facing the heating target member, and a cooling layer positioned in contact with an opposite surface to a heat insulating layer's surface facing the heating layer.
申请公布号 JP5430192(B2) 申请公布日期 2014.02.26
申请号 JP20090068287 申请日期 2009.03.19
申请人 发明人
分类号 H01L21/3065 主分类号 H01L21/3065
代理机构 代理人
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